Bragg brentano xrd12/15/2023 ![]() ![]() Stock, “Elements of X-ray Diffraction,” Prentice Hall, New Jersy, p. Yasaka Miho, “X-ray thin-film measurement techniques V. Schaeben, Texture Analysis with MTEX – Free and Open Source Software Toolbox. Birkholz, Thin Film Analysis by X-Ray Scattering (WILEY-VCH Verlag GmbH & Co. Wilson, Scherrer after sixty years: A survey and some new results in the determination of crystallite size. Ohring, Materials Science of Thin Films, 2nd Editio. High resolution X-ray diffractometry,” Rigaku J. Konya, “X-ray thin-film measurement techniques III. Mitsunaga, X-ray thin-film measurement techniques II. Förster, “Kα 1,2 and Kβ 1,3 x-ray emission lines of the 3d transition metals,” Phys. The aim of this article is to ultimately lower the barrier for researchers to perform meaningful XRD analysis, and, building on this foundation, find the existing literature more accessible, enabling more advanced XRD investigations. Finally, we discuss some of the basics of data analysis, and give recommendations on the presentation of data. Practical guidelines for selecting the appropriate optics, mounting and aligning the sample, and selecting scan conditions are given. Next, we introduce five types of measurements essential for thin film characterisation: \(2\theta /\omega\) scans, grazing-incidence scans, rocking curves, pole figures, and azimuth scans (or ϕ scans). We give a brief introduction of the principle of diffraction and description of the instrument, detailing the relevant operation modes. In this tutorial article, we provide a foundation for the thin-film engineer/scientist conducting their first measurements using XRD. For the beginner, however, it can be a daunting technique at first due to the number of operation modes and measurements types, as well as the interpretation of the resultant patterns and scans. X-ray diffraction (XRD) is an indispensable tool for characterising thin films of electroceramic materials. ![]()
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